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ISBN
:
9783540604464
Publisher
:
Springer
Subject
:
Information Technology: General Issues, Computer Science
Binding
:
Paperback
Year
:
1996
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11255.0
₹
9116.0
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Discussing the structure and evolution of the self-trapped exciton (STE) in a range of materials, this work includes a comprehensive review of experiments and extensive tables of data. Topics examined include spontaneous symmetry breaking, lattice defect formation and electronic sputtering.
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