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CMOS Digital Integrated Circuits Analysis and Design 25.0%OFF

CMOS Digital Integrated Circuits Analysis and Design

by Sung-Mo (Steve) Kang and Yusuf Leblebici

  • ISBN

    :  

    9780070530775

  • Publisher

    :  

    Tata Mcgraw Hill Education Private Limited

  • Subject

    :  

    Encyclopaedias & Reference Works

  • Binding

    :  

    Paperback

  • Pages

    :  

    672

  • Year

    :  

    2002

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  • Description

    The 3rd edition of CMOS Digital Integrated Circuits: Analysis and Design is the most comprehensive publication available on CMOS circuits, and it is suitable for Electrical Engineering and Computer Science students at the senior and first-year graduate levels. The field of digital integrated circuit design is an ever-evolving one, and this book has tried to provide up-to-date material on all subjects covered. Beginning with CMOS processing, the book provides in-depth knowledge on basic CMOS gates, I/O circuits, MOS transistor models, design for manufacturability, interconnect effects, dynamic circuits, BiCMOS circuits, VLSI design methodologies, design for testability, memory circuits, and low power design techniques. Out of a total of fifteen chapters, the initial ten chapters cover the basic concepts. The later chapters cover the advanced issues in detail. Besides explaining the theoretical aspects of the basic design concepts in detail, the book also covers well-explained illustrations for clearer understanding. Several SPICE stimulation results have been included to explain the basic concepts better. Sung-Mo Kang is a scientist, inventor and author. He worked at the University of California, Merced, as the Vice Chancellor. Dr. Kang has authored Computer Aided Design of Optoelectronic Integrated Circuits and Systems, Physical Design for Multichip Modules, Hot-Carrier Reliability of MOS VLSI Circuits, and Electrothermal Analysis of VLSI Systems. Kang was born in Seoul, South Korea. Yusuf Leblebici completed his PhD degree in Electrical and Computer Engineering from the University of Illinois at Urbana Champaign in 1990. He is a Fellow of the IEEE, and the Chair Professor at the Swiss Federal Institute of Technology in Lausanne. Leblebici has co-authored Hot-Carrier Reliability of MOS VLSI Circuits with Dr. Kang, and other books like Fundamentals of High Frequency CMOS Analog Integrated Circuits, and CMOS Multichannel Single-Chip Receivers for Multi-Gigabit Optical Data Communications.

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